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【英文标准名称】:InterpretationstoB16.34-1996Valves-Flanged,Threaded,andWeldingEndIncludesInterpretationNo.2
【原文标准名称】:B16.34-1996的说明.阀门.带法兰、有螺纹和焊接端部.包括说明2
【标准号】:ASMEB16.34INTERPRETATIONS-1998
【标准状态】:现行
【国别】:美国
【发布日期】:
【实施或试行日期】:
【发布单位】:美国机械工程师协会(US-ASME)
【起草单位】:
【标准类型】:()
【标准水平】:()
【中文主题词】:
【英文主题词】:
【摘要】:InterpretationstoB16.34-1996Valves-Flanged,Threaded,andWeldingEndIncludesInterpretationNo.2
【中国标准分类号】:J16
【国际标准分类号】:23_060_10
【页数】:
【正文语种】:英语


【英文标准名称】:StandardGuideforSpecimenPreparationandMountinginSurfaceAnalysis
【原文标准名称】:表面分析中试样制备和安装程序的标准指南
【标准号】:ASTME1078-2002
【标准状态】:现行
【国别】:
【发布日期】:2002
【实施或试行日期】:
【发布单位】:美国材料与试验协会(US-ASTM)
【起草单位】:E42.03
【标准类型】:(Guide)
【标准水平】:()
【中文主题词】:精整;分析;原子吸收分光光度测定法;X射线技术;表面;试样;金属;光谱学;俄歇电子能谱学
【英文主题词】:augerelectronspectroscopy;secondaryionmassspectroscopy;specimenmounting;specimenpreparation;specimentreatment;surfaceanalysis;x-rayphotoelectronspectroscopy
【摘要】:Properpreparationandmountingofspecimensisparticularlycriticalforsurfaceanalysis.Improperpreparationofspecimenscanresultinalterationofthesurfacecompositionandunreliabledata.Specimensshouldbehandledcarefullysoastoavoidtheintroductionofspuriouscontaminantsinthepreparationandmountingprocess.Thegoalmustbetopreservethestateofthesurfacesothattheanalysisremainsrepresentativeoftheoriginal.Augerelectronspectroscopy(AES),X-rayphotoelectronspectroscopy(XPSorESCA),andsecondaryionmassspectrometry(SIMS)aresensitivetosurfacelayersthataretypicallyafewnanometers(nm)thick.Suchthinlayerscanbesubjecttosevereperturbationscausedbyspecimenhandling(1)3orsurfacetreatmentsthatmaybenecessarypriortointroductionintotheanalyticalchamber.Inaddition,specimenmountingtechniqueshavethepotentialtoaffecttheintendedanalysis.Thisguidedescribesmethodsthatthesurfaceanalystmayneedtominimizetheeffectsofspecimenpreparationwhenusinganysurface-sensitiveanalyticaltechnique.Alsodescribedaremethodstomountspecimenssoastoensurethatthedesiredinformationisnotcompromised.GuideE1829describesthehandlingofsurfacesensitivespecimensand,assuch,complementsthisguide.1.1Thisguidecoversspecimenpreparationandmountingpriorto,during,andfollowingsurfaceanalysisandappliestothefollowingsurfaceanalysisdisciplines:1.1.1Augerelectronspectroscopy(AES),1.1.2X-rayphotoelectronspectroscopy(XPSandESCA),and1.1.3Secondaryionmassspectrometry,(SIMS).1.1.4AlthoughprimarilywrittenforAES,XPS,andSIMS,thesemethodswillalsoapplytomanysurfacesensitiveanalysismethods,suchasionscatteringspectrometry,lowenergyelectrondiffraction,andelectronenergylossspectroscopy,wherespecimenhandlingcaninfluencesurfacesensitivemeasurements.1.2Thisstandarddoesnotpurporttoaddressallofthesafetyconcerns,ifany,associatedwithitsuse.Itistheresponsibilityoftheuserofthisstandardtoestablishappropriatesafetyandhealthpracticesanddeterminetheapplicabilityofregulatorylimitationspriortouse.
【中国标准分类号】:N04
【国际标准分类号】:
【页数】:9P.;A4
【正文语种】: